Scanning Tunneling Microscopy And Its Applications. 2nd, Revised Edition (Relié)

This volume presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After examining the available instrumentation and the methods for tip and surface preparation, the book provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nano-fabrication. It examines the limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.