Aberration-Corrected Analytical Transmission Electron Microscopy (Relié)

Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. This book presents the background and implementation of techniques which have allowed true imaging and chemical analysis at the scale of single atoms as applied to the fields of materials science and nanotechnology.
Edited and written by the founders of the world's first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text : Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes ; Is based on an established course taught at postgraduate summer schools by leaders in this field ; Is essential reading for researchers involved in the analysis of materials at the nanoscale.
Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.